Regarding Calculation of Reflectance/Transmittance using DFT Power Monitors
Dear Concerned Personnel,
I wanted to ask a fundamental question pertaining to the procedures following calculation of reflectance/transmittance using DFT power monitors. During the calculations of reflectance/transmittance from a scattering sample, when we are using a broadband plane-wave source as the incident beam, how does the beam profile shape (broadband source) affect the calculation? Do we normalize the measured reflectance/transmittance by the incident beam profile?
Please let me know if my question is not clear or requires more elaboration.