-
-
February 7, 2023 at 5:06 pm
ssj
SubscriberHi,
I obtained the absorption spectra of a semiconducting layer using (a) periodic boundary condition and (b) PML boundary condition and observed that it greatly differ in both the cases. The absorption under PML boundary condition is lesser that the case where periodic boundary condition is used. Can you please help me undestand why is it so? What does this physically mean? I understand that if a nanostructure is placed on top of the semiconducting layer, applying a periodic boundary condition will replicate a nanostructure array compared to a single nanostructure when PML is used, and hence the absorption in the semiconducting layer can be higher in the former. But how can we explain the difference in case of a bare semiconducting layer?
Thanks in advance!
-
February 8, 2023 at 1:38 am
Guilin Sun
Ansys EmployeeThey should be different, since when PML boundary conditions are used, it will truncate the plane wave, causing diffraction.
The correct way for the thin-film type ( layered as you said) is to use periodic BCs. This is becuase they are assumed infinitely long perpendicular to the thickness axis. They are also periodic in principle.
-
- You must be logged in to reply to this topic.

Boost Ansys Fluent Simulations with AWS
Computational Fluid Dynamics (CFD) helps engineers design products in which the flow of fluid components is a significant challenge. These different use cases often require large complex models to solve on a traditional workstation. Click here to join this event to learn how to leverage Ansys Fluids on the cloud, thanks to Ansys Gateway powered by AWS.

Earth Rescue – An Ansys Online Series
The climate crisis is here. But so is the human ingenuity to fight it. Earth Rescue reveals what visionary companies are doing today to engineer radical new ideas in the fight against climate change. Click here to watch the first episode.

Ansys Blog
Subscribe to the Ansys Blog to get great new content about the power of simulation delivered right to your email on a weekly basis. With content from Ansys experts, partners and customers you will learn about product development advances, thought leadership and trends and tips to better use Ansys tools. Sign up here.
- 软件打不开
- Ganhemt Project mistake can you help me
- how to export results from SPEOS to Mechanical
- Negative Reflection Problem
- Simple Optical simulation
- How to calculate the cross-polarization efficiency and phase in FDTD
- Ansys SPEOS- Diffusion Coefficient of a fluorescence
- Inverse design of polymer y-branch – modify the example provided
- Purcell Factor on Dielctric Mirror
- Light reflection on a XMP map
-
3778
-
2575
-
1825
-
1242
-
598
© 2023 Copyright ANSYS, Inc. All rights reserved.