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September 23, 2023 at 3:59 am
Anindya Bose
SubscriberDear Experts,
The below-mentioned link shows some insights on the creation of an index perturbation model. If I want to see the index perturbation behavior of a thin layer (for example a newly created material X) deposited on a substrate silicon then what are the choices for choosing the option base material in this tab? Technically it should be silicon itself but choosing silicon in my case is affecting the refractive index of material X(the epilayer). Moreover, I am getting the power vs. refractive index curve with a starting index similar to the refractive index of silicon. Can you please comment on this? Am I making any mistakes here, please suggest.
Link: https://optics.ansys.com/hc/en-us/articles/360034901753-np-Density-and-Temperature-Index-Perturbation-Simulation-object
Thanks and regards,
Anindya Bose
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October 3, 2023 at 5:48 pm
Anindya Bose
SubscriberDear Mr Guilin Sun,
Can you please share your thoughts regarding my query?
Thanks and regards,
Anindya Bose
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October 3, 2023 at 10:59 pm
Guilin Sun
Ansys EmployeeSorry the original reply was not successful.
The base material is always what the origial material is when there is no voltage/injecting power is applied to HEAT or CHARGE. In your case it seems it should be material X. Please choose the referenace point, eg no heat or charge generated and see if the result is the same as the original material.
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