Learning Forum

[Kristiyan Petkov]

Hello everyone! I have to simulate the field of a radiation element and plot the S11 parameter of a silicon wafer placed in the vicinity of this field. My model is shown in the following picture:

I have a radiating element (consisting of yellow and green elements), a wafer (shown in gray not fully transparent), and a radiation box(transparent).

My signal has a frequency of 9 GHz and is applied by a lumped port at the back of the radiation element shown here:

I have only this excitation and only one boundary condition on the transparent box-Radiation boundary.

All materials are assigned:

The radiation box is made of air, the wafer is silicon, the yellow parts of the radiating element are made of gold, and the green part of Taconic RF-60.

My question is: 

How can I get the graphical 2D plot of the S11 parameter (as a function of frequency) of the wafer with a frequency sweep from 8 to 12 GHz, using the field that is radiated from the element as the one interacting with the wafer?  I need it because my task is to measure how much is the reflected signal compared to the transmitted signal (V0- / V0+).

Finally, I attach a picture of the 3D plot of the field that I simulated (which is the one that I want to use as the signal for the S11 parameter):

The first picture here is the E field magnitude in the radiation box and the second one is the E field magnitude at the surface of interest of the silicon wafer.

Best wishes!

Kristiyan

[Chinmay T]

 

Hello,

Have you created the frequency sweep setup under solution setup?

To plot S11 parametere, in Project Manager window, right-click on Results > Create Modal/Terminal Solution Data Report > Rectangular Plot.

In Report window, select the required parameters and click on New Report.

Thank you,
Chinmay

 

[Kristiyan Petkov]

Dear Chinmay,

Thank you for the response. Yes, I have created the frequency sweep in the solution setup.

I also used Results>Create Modal Solution>Rectangular Plot and clicked on the S11 parameter.

The problem is that it displays the same graph for S11 even if I change the material of the silicon wafer to galium arsenide or anything else. I think the S11 parameter is shown for the excitation that I showed in my post(at the back face of the radiating element).

I need the S11 or anything else that can give me information about the reflected wave at the face of the wafer in order to see how different materials react to the electromagnetic field of the radiation element. 

Right now S11 gives me information only about the S11 at the excitation of the radiating element.

Regards,

Kristiyan

[Chinmay T]

Hello,

In this case, you need two radiating elements situated in far field distances (the faces of both the radiating elements should be opposite to each other). Then measure the S21 with air in between two radiating elements and then insert the test sample (wafer) and compare the S21 parameters for both cases.

Thank you,
Chinmay